XSP-SIMS study of trapped states of deuterium implanted into a pyroytic graphite
Proc. Hokkaido Univ. Symp. on Effective Utilization of Surface Analysis Techniques in PSI, Oct(1982) 232-238
Kuniaki Watanabe, Kan Ashida, Kenji Ichimura
Tritium Research Center, Toyama University, 3190 Gofuku, Toyama 930, Japan
Abstract
Trapped states of deuterium implanted into a pyroytic graphite with 5 keV
investigated by means of X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS).
Chemical shift of the C1s peak was observed in the XPS spectra due to the deuterium implantation at room
temperature.
The shift increased with the deuterium fluence to reach a constant value (0.4 eV).
In the SIMS spectra, CD- and C2D- peaks arised due to the implantation.
The relative intensity of the former increased with the fluence to reach a constant value, whereas
that of the latter passed through a maximum to decrease to a constant value.
A linear relation was observed between the chemical shift and the relative intensity of the CD- peak.
The chemical shift and theCD- peak disappeared by annealing the sample at 600℃,
whereas the C2D- peak disappeared at 900℃.
On the basis of these observations, it is concluded that the deuterium is trapped in/on
the graphite in two different states: one is C-D (on-top form) and the another is C2-D (bridge form) species.