Two different species of deuterium implanted into a pyrolytic graphite observed by XPS-SIMS
J. Vac. Sci. Technol. A, 1(3) (1983) 1465-1468
Kan Ashidaa, Kenji Ichimurab, Kuniaki Watanabeb
aRadio-isotope Laboratory, Toyama University, Gofuku 3190, Toyama 930, Japan
bTritium Research Center, Toyama University, Gofuku 3190, Toyama 930, Japan
Abstract
Trapped states of deuterium implanted into a pyrolytic graphite with 5 keV
were investigated by means of the x-ray photoelectron spectroscopy and the secondary ion mass spectrometry.
Chemical shift and broadening of C1s peak were observed XPS spectra due deuterium-ion implantation at
room temperature.
The shift and the broadening increased with the deuterium fluence to reach constant values.
In the SIMS spectra, CD- and C2D- peaks appeared due to the deuterium
implantation.
The intensity of the CD- peak increased with the fluence to reach a constant value,
whereas that of the C2D- peak passed through a maximum to decrease to a constant value.
A linear relation was observed between the chemical shift and the CD- peak.
The chemical shift and the CD- peak disappeared after annealing at 600℃ for 5 min,
whereas the broadening of the C1s peak and the C2D- peak disappeared after annealing
the sample at 900℃ for 5 min.
On the basis of these observations, it is concluded that at least two different species of
the deuterium are formed in the graphite due to the deuterium implantation.
PACS numbers: 82.80. Ms, 79.60. - I, 82.80. Pv, 61.70. Tm